Guide Wafer-Level Testing and Test During Burn-In for Integrated Circuits

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Wafer-Level Testing and Test During Burn-in for Integrated Circuits

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US7928754B2 - Wafer level burn-in and electrical test system and method - Google Patents

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Click on the cover image above to read some pages of this book! Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form.

Definition

This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in WLTBI helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints.

C2WIDE One Body Probe Pin for IC Final Test and Burn-In Test

Moreover, this unique book helps practitioners address the issue of enabling next generation products with previous generation testers. New Condition: New Hardcover. Save for Later.


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  5. Shipping: Free Within U. About this title Synopsis: Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form.

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    Wafer-Level Test and Burn-in (WLTBI)

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